KENNEDY KEN3350020K 25-50mm EXTERNAL MICROMETER

KENNEDY KEN3350020K

Kennedy External Micrometers
Kennedy Enamelled Frame External Micrometers for taking external measurements accurately. The alloy steel spindle is held rigid in a drop forged steel frame and is fitted with a speeder type ratchet thimble for rapid adjustment and a fine adjustment thimble for taking precise measurements. The spindle can be locked in position by the using the spindle lock lever this retains the spindle position for reference. The anvils are optically flat tungsten carbide for a hardwearing contact surface that ensures precise measurements every time. Manufactured to BS 870. Accuracy: Flatness: 0.6mm. Parallelism:(2 L/100) mm (fraction rounded down). Instrumental error:/-(1 L/75) mm (fraction rounded up). L maximum measuring length.

Metric External Micrometers Tungsten Carbide Tipped Anvils.